EE 421L
Digital Integrated Circuit Design Laboratory
Laboratory 4:  IV Characteristics and Layout of NMOS and PMOS devices in ON’s C5 Process

 

AUTHOR: Bryan Kerstetter

EMAIL: kerstett@unlv.nevada.edu

SEPTEMBER 25, 2019

 

 


General Overview

This laboratory introduces the MOSFET (the Metal Oxide Semiconductor Field Effect Transistor). This laboratory touches upon laying out both the NMOS and the PMOS in the C5 process. These laid out MOSFETs are then characterized. This laboratory is similar to another laboratory that I took (EE 420L: Characterization of the CD4007 CMOS Transistor Array).


Prelab

 

All previous laboratory work has been backed up.

 

Three terminal NMOS used to create symbol.

 

Figure 1

 

Symbol created from schematic.

 

Figure 2

 

Circuit designed to characterize NMOS.

 

Figure 3

 

Here, we can see the triode and saturation regions of the MOSFET with varying gate to source voltages.

 

Figure 4

 

Here we see the layout of PMOS.

 

Figure 5

 

The extracted view indicates that there are indeed four pins of the NMOS. The three terminal MOSFET has a hidden fourth pin. This hidden fourth pin is assumed to be automatically connected to ground in the schematic. In layout, the bulk of the transistor is not connected to ground. Therefore, the layout will not LVS.

 

Figure 6

 

The layout is modified to accommodate a MOSFET bulk connection.

 

Figure 7

 

The final layout of the NMOS passes the DRC.

 

 

Extracted view of the NMOS layout.

 

Figure 8

 

Does not pass the LVS because we are using a three terminal MOSFET in the schematic.

 

Figure 9

 

 Does not LVS because the 4 terminal NMOS is needed in the schematic. Therefore, the four terminal NMOS is used with the bulk connected to ground.

 

Figure 10

 

LVS is run again and this time the netlists of the schematic and the layout match.

 

Figure 11

 

The extracted layout was then simulated. It is noted that the extracted simulation matches the schematic simulation.

 

Figure 12

 

Simulation -> Netlist -> Display to ensure extracted simulation.

 

Figure 13

 

 

PMOS

 

Now all the previous steps are performed for the complimentary MOS, the PMOS.

 

Figure 14

 

A symbol was created for the PMOS.

 

Figure 15

 

A layout was made for the PMOS.

 

Figure 16

 

Passes DRC:

 

Figure 17

 

Extracted View:

 

Figure 18

 

Circuit designed to characterize the PMOS.

 

Figure 19

 

Schematic Simulation

 

Figure 20

 

Extracted Simulation

 

Figure 21

 

Figure 22

 


 

Laboratory Procedure

 

MOSFET Characterization in the C5 Process

1.     A schematic for simulating ID v. VDS of an NMOS device for VGS varying from 0 to 5 V in 1 V steps while VDS varies from 0 to 5 V in 1 mV steps. Use a 6u/600n width-to-length ratio.

Schematic:

Figure 23

Simulation:

Figure 24

2.     A schematic for simulating ID v. VGS of an NMOS device for VDS = 100 mV where VGS varies from 0 to 2 V in 1 mV steps. Again, use a 6u/600n width-to-length ratio.

Schematic:

Figure 25

Simulation:

Figure 26

Note, this indicates that the threshold voltage for the NMOS is around 0.7 volts.

3.     A schematic for simulating ID v. VSD (note VSD not VDS) of a PMOS device for VSG (not VGS) varying from 0 to 5 V in 1 V steps while VSD varies from 0 to 5 V in 1 mV steps. Use a 12u/600n width-to-length ratio.

Schematic:

Figure 27

Simulation:

Figure 28

4.     A schematic for simulating ID v. VSG of a PMOS device for VSD = 100 mV where VSG varies from 0 to 2 V in 1 mV steps. Again, use a 12u/600n width-to-length ratio. 

Schematic:

Figure 29

Simulation:

Figure 30

Here we can see that the threshold for PMOS is around 0.9 volts.

The Probing Pad

The following is the specifics of the rules regarding probing pads (as provided by MOSIS).

Figure 31

Here are the dimensions of the probing pad that was designed.

Figure 32

Here we created a schematic for the probing pad.

Figure 33

From the schematic we created a symbol so that eventually our design can go through a LVS.

Figure 34

Lay Out NMOS with Pads

The NMOS symbol (Figure 35) and layout (Figure 36) was modified and passed DRC (Figure 37) and LVS (Figure 38).

Figure 35

Figure 36

Figure 37

Figure 38

A schematic was created.

Figure 39

The schematic was then translated into a layout.

Figure 40

Here is a closer view of the layout.

Figure 41

Here is the extracted view of the layout.

Figure 42

The layout passes both DRC and LVS.

Figure 43

The symbol was modified so that one may easily identify the NMOS has probing points attached to all four terminals.

Figure 44

We then used the following schematic to ensure that our layout functions properly.

Figure 45

The simulation testifies to the fact that our layout functions properly.

Figure 46

It was ensured that the simulation simulated was the extracted cell.

Figure 47

 

Lay Out PMOS with Pads

The following circuit was created.

Figure 48

Here is the final layout of the PMOS connected to four pads.

Figure 49

Here is a closer view of the layout.

Figure 50

Here is the extracted view of the layout.

Figure 51

Our layout passes both the DRC and the LVS.

Figure 52

The following symbol was created to indicate a PMOS with probing points attached to all 4 terminals.

Figure 53

The following circuit was used to determine if the laid out PMOS properly functions.

Figure 54

The simulation as seen in Figure 55 testifies that our laid out PMOS properly functions.

Figure 55

It was ensured that the extracted PMOS was what went under the simulation.

Figure 56

All work up to this point was backed up.

 


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