FTD (Fast Transient Digitizer)

 

Project Members:

 

R. Jacob Baker (rjacobbaker@gmail.com)  

James Mellott (mellott@unlv.nevada.edu)

Eric Monahan (monahan@unlv.nevada.edu)

Angsuman Roy (angsumanroy@gmail.com)


FTD Chip

 

This test chip was fabricated using the C5 process and consists of the following circuitry:

 

256 Stage FTD w/on chip decoupling capacitor

 


 

Pad Frame/Key

 

 


 

Pin Table

 

Pin #

Name on Pad Key

Pin Description

1

No Con

n/a

2

No Con

n/a

3

No Con

n/a

4

No Con

n/a

5

No Con

n/a

6

No Con

n/a

7

No Con

n/a

8

No Con

n/a

9

No Con

n/a

10

GND

Ground Pad

11

VDD

VDD Pad

12

No Con

n/a

13

No Con

n/a

14

Vinvco

Bias Generator Control Voltage

15

Res Out

Bias Generator Resistor to set Current

16

Trig_out

Output after 256 stages of trigger input signal

17

N Con

n/a

18

A0

Decoder 0 input

19

A1

Decoder 1 input

20

In

Analog signal input Pad

21

Out

Analog output Pad to off chip resistor

22

A2

Decoder 2 input

23

A3

Decoder 3 input

24

A4

Decoder 4 input

25

Trig_in

Trigger input to start capturing analog input signal

26

A5

Decoder 5 input

27

A6

Decoder 6 input

28

A7

Decoder 7 input

29

Ve

Enable input for decoder

30

VDD

VDD Pad

31

GND

Ground Pad

32

No Con

n/a

33

No Con

n/a

34

No Con

n/a

35

No Con

n/a

36

No Con

n/a

37

No Con

n/a

38

No Con

n/a

39

No Con

n/a

40

No Con

n/a

 

 


 

Pin Table

  

FTD

Component

Trigger In

Trigger Out

Analog In

Analog Out

Ground

FTD

Pin 25

Pin 16

Pin 20

Pin 21

10, 31

 


 

FTD Flow Chart

 

 

Fast Transient Digitizer

 

The Fast Transient Digitizer captures a fast signal in adjustable time intervals which can be read out at a slower speed to analyze the data.  The adjustable time intervals between each capture varies from 0.929 ns to 6 ns per stage.  The read out process is done using a series of 4x16 decoders which can access any stage to determine the “strength” of the analog signal at that time which can be determined by knowing when the Trigger Input goes low and the time interval between the stages.

 

This work is the continuation of the Transient Digitizer Integrated Circuit Design with improvements in layout and circuit design.

 


 

Single Stage Layout

 

 

This new layout structure per stage is laid out according to the signal flow which results in better performance over earlier designs, also the Analog Input and Output signal lines were separated to reduce induced noise.

 


 

Bias Generation

 

The Bias Generation circuit allows us to adjust the time interval between each stage.  Each stage utilizes two current starved MOSFET’s which are controlled from the bias generation circuit above.

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