Lab 8 – Characterization of the CMOS Transistor Array

EE 420L Analog IC Design

Lab Date: 4/03/19  Due: 4/10/19

By David Santiago – Email: santid4@unlv.nevada.edu

Last Edited on 4/09/19 at 10:45pm using Word

  

Super NOTE: We did not have the CD4007 chip available in the lab, so the TA and Dr. Baker said that the CD4007UBE chip is okay. Values may be different.

 

Lab description:

After using NMOS transistors and PMOS transistors, we will finally be able to use a special transistor called a Complementary Metal-Oxide Semiconductor, also known as:  

 

CMOS Transistor Arrays are basically NMOS transistors and PMOS transistors all in one big tray of silicon.

Image result for cmos side view

 

In this lab, we will be solving for the characteristics of the CMOS chip using experimental results, and then using these characteristics and making our own Level 1 Model transistors in LTSpice.

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Part 1: The NMOS

Experiment 1: ID vs VGS

In this experiment, while VDS = 3V, we will be sweeping VGS and finding the current values for ID.

 

Results:

  

From looking at this graph we can say that our Threshold Voltage can be around

      VT0 = 1.3V

 

 

Experiment 2: ID vs VDS

In this experiment, at different values of VGS, we will be sweeping VDS and recording the values of ID.

 

At VGS = 1: NOTE this is in Microamps               VGS = 2:

 

 

VGS = 3:                                               VGS = 4:

 

 

VGS = 5:

 

Now here is all of the VGS currents in one big graph:

 

 

Experiment 3: ID vs VGS (With varying VSB)

In this experiment, we will be changing VSB by grounding VB and applying a positive voltage at VS.

 

At VSB = 0:                                          VSB = 1:

 

 

VSB = 2:                                               VSB = 3:

 

 

Here is a graph with all of the different VSB currents:

 

 

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Part 2: The PMOS

Experiment 1: ID vs VSG

We will do everything we did for the NMOS but for the PMOS transistor.

Sweeping VSG from 0V to 3V with VSD = 5V – 2V = 3V

 

Threshold Voltage = 1.5V, VT0 = -1.5V

 

Experiment 2: ID vs VSD

Using different VSG voltages, we will record the current ID over sweeping VSD.

BIG NOTE: As we keep going to higher VSD voltages, our Battery source got to a point where it could no longer let us have a higher VSG voltage. This could be due to the battery source sensing that there is a “short” in the PMOS. Because of this we will have INACCURATE measurements. For those higher VSD voltages at the higher constant VSG, we used the same value as the highest max value of our VSG, so the lines will look linear.

VSG = 1:                                               VSG = 2:

 

 

VSG = 3: Highest VSD=4.5V                  VSG = 4: Highest VSD=2.5V

 

 

VSG = 5: Highest VSD=2V

 

 

Here is all of our VGS currents:

 

 

Experiment 3: ID vs VSG (With varying VBS)

In this experiment, we will be connecting VB to VDD = 5V and changing VS.

 

VBS = 0V:                                             VBS = 1V:

 

 

VBS = 2V:                                             VBS = 3V:

 

 

Here are all of the VBS curves in one graph!

 

 

Part 3: Figuring out the Characteristics

 

Things that need to be found: tox, VT0, Gamma, Kp, Lambda.

 

TOX = εOX / C’OX           εOX =3.97* ε0 , ε0 = 8.85 x 10-12 F/m

 

C’OX = COX / (W*L), Given W = 500μm, L = 5μm, COX = 5pF

C’OX =  2mF/m2

 

TOX = εOX / C’OX = 3.97 x 8.85 x 10-12 / 2m

TOX = 17.57nm

 

VT0: For the NMOS, VTHN = 1.3V         VT0N = 1.3V

         For the PMOS,   VTHP = 1.6V,         VT0P = -1.6V

 

Gamma: The equation for Gamma given in the CMOS textbook:

Γ = sqrt(2 x q x εSI x NA) / C’OX    Given that εSI = 11.7ε0, q = 1.6 x 10-19 C,

                                                   NA = 1016 atoms/cm3

 

Γ = sqrt(2 x (1.6x10-19) x (11.7x8.85x10-12) x 1016/10-6) / 2x10-3

Γ = .287 V1/2

 

Lambda: From Experiment:   NMOS

Slope = (1.763-1.559)mA/(5-1)V = 51μA/V ,

ID,SAT = 1.6mA, VGS = 3V

         Given rO = 1 / [ID,SAT x λ ], rO = 1/SLOPE,

         ΛN =SLOPE/ID,SAT = .0319 V-1

 

PMOS: Slope = (1.139 - .991)m / 5-2 = 49.33μA/V

         ID,SAT = .922mA, VSG = 3V

         ΛP =SLOPE/ID,SAT =  .0535 V-1

 

Kp:

         Using the ID equation: ID = Kp/2 (W/L) (VGS – VTH)2

Using Experimental Values:  Given W/L = 500μ/5μ = 100, ID = 6.83mA,

         KpN = 2ID / [ (W/L)(VGS – VTHN)2 ] = 2(1.6m) / [ (100)(3 – 1.3)2  ]

        KpN = 11.07μA/V

 

         KpP = 2(.922m) / [ (100)(3-1.5)2]

     KpN = 8.2μA/V

 

 

LTSpice Models:

NMOS:

 

NMOS VGS:                                         Experimental:

           

From this, even though we went by .2 increments, we got pretty close to what our experiment says.

 

NMOS ID vs VDS:                                Experimental:

    

From this, our VGS=5V is a bit higher than our Experiment, and that could be due to how we can calculate ID Saturation current and VVD,SAT. But with 0.5V increments, this is in the ballpark and good for our simulations.

 

NMOS ID vs VGS with changing VSB:

 

From this, our VSB from the experiment would have been better if we used .1V increments due to some of the points at the higher VSB. As we increase VSB, it will take much more voltage VGS to get any current to come out of the NMOS.

 

PMOS:

 

PMOS VGS:                                 Experiment:

 

 

From our LTSpice simulation (And from using only 0.5V increments), we can say that we are also in the ballpark of making our simulations look like our Experimental results.

 

PMOS ID vs VSD:                                 Experimental:

 

Because our Battery Source would not let us sweep at a higher VSD at higher VSG voltages, we had a harder time figuring out our lambda and our ID and VDS saturation parameters. However, we did manage to get close, and are off by a magnitude of around 1.5.

 

PMOS ID vs VSG with changing VBS:

 

NOTE: Since the gammas for the PMOS and NMOS are different and we are not given any way of solving for gamma, we had to change the gamma parameter in LTSpice to about 2.5. Due to the big error that our Battery source was giving us, this is as accurate as we can get.

 

Part 3: The inverter:

Experiment 4:

In this experiment, we will just be looking at how fast the Output reacts with the input of the inverter and compare it with our LTSpice models. We will have a small capacitance at the Probe tip, ideally 15pF, but there will be some stray capacitance and we used 30pF to be safe.

 

Experimental:

      Delay = 18ns

 

Our Level 1 LTSpice Model:

      Delay = 13ns

From this, we can say that we have made a great attempt at recreating our experimental CMOS transistor array into LTSpice. We are off by a small margin, but this is still good and we can say that this is good for a Level 1 Model.

 

 

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