Selected Talks

* Favorite of CMOSedu.com users!!!

Publications

2009

2008

2007

  • Keeth, B., Baker, R.J., Johnson, B., and Lin, F., “DRAM Circuit Design: Fundamental and High-Speed Topics,” Wiley-IEEE, 2007. ISBN 978-0-470-18475-2
  • Baker, R.J., “CMOS Circuit Design, Layout, and Simulation, Revised Second Edition” Wiley-IEEE, 2007. ISBN 978-0-470-22941-5
  • Knowlton, W.B., Araujo, D., Price, P.M., Brotherton, J., Coonse, K., Hendricks, K., Southwick III, R.G., Henderson, J., Oxford, J., Moll, A., Kuang, W., and Baker, R.J., Progress Towards a Biomolecular Nanowire Sensor Array for Biomedical Applications,” invited talk presented at the 6th Annual INBRE/COBRE Research Conference, Moscow, ID, August 6, 2007
  • Knowlton, W.B., Araujo, D., Price, P.M., Brotherton, J., Coonse, K., Southwick III, R.G., Oxford, J., Moll, A., Baker, R.J., and Kuang, W., Development of Biomolecular Nanostructure Sensor Arrays,” presented at the Sensors and Sensor Technology session for the program of the 88th annual meeting of the AAAS, Pacific Division, June 2007, Boise, ID
  • Knowlton, W.B., Kuang, W., Araujo D., Price, P.M., Brotherton, J., Coonse, K. Bollschweiler, L., Southwick, R., Oxford, J. Moll, A., and Baker, R.J., “Nanofabrication of 3D Sensor Arrays for Detection,” Advanced Fuel Cycle Workshop, May 8-9, 2007, Boise, ID

2006

2005

2004

  • Cheek, B.J., Southwick III, R.G., Ogas, M.L., Nagler, P.E., Whelchel, D., Kumar, S., Baker, R. J., and Knowlton, W. B., “Preliminary Soft Breakdown (SBD) Effects In CMOS Building Block Circuits,” poster presentation at 2004 IEEE International Integrated Reliability Workshop, Oct. 18-21.
  • Ogas, M., Southwick III, R. Cheek, B., Lawrence, C., Kumar, S., Haggag, A., Baker, R.J., and Knowlton, W.B., “Multiple Waveform Pulse Voltage Stress Technique for Modeling Noise in Ultra Thin Oxides,” poster presentation at Workshop on Microelectronics and Electron Devices, Boise, Idaho, April 16, 2004.
  • Cheek, B. J., Stutzke, N., Santosh K., Baker, R.J., Moll, A.J., and Knowlton, W.B., "Investigation of Circuit-Level Oxide Degradation and its Effect on CMOS Inverter Operation Performance and MOSFET Characteristics,", 2004 IEEE International Reliability Physics Symposium, April, 25-29.

2003

2002

  • Cheek, B.J., Lawrence, C.E., Lawrence, T.E., Gomez, J., Caldwell, T., Kiri, D., Kumar, S., Baker, R.J., Moll, A.J., and Knowlton, W.B., "Gate Dielectric Degradation Effects on nMOS Devices and Simple IC Building Blocks (SICBBs)," IEEE Electron Devices Society Boise Meeting, Boise, ID Oct. 25.
  • Lawrence, C.E., Cheek, B.J., Caldwell, T.E., Lawrence, T., Kiri, D., Kumar, S., Baker, R.J., Moll, A.J., and Knowlton, W.B., “Pulse voltage stressing of ultrathin gate oxides in NMOS devices,” poster session at IEEE International Integrated Reliability Workshop, October 21-24.
  • Cheek, B.J., Lawrence, C.E., Lawrence, T.E., Caldwell, T., Kiri, D., Kumar, S., Baker, R.J., Moll, A.J., and Knowlton, W.B., “Circuit level reliability of ultrathin gate oxides for SICBBs: Preliminary study concentrated on the effect of stress on the NMOSFET of an inverter,” poster session at IEEE International Integrated Reliability Workshop, October 21-24.
  • Baker, R.J., "Sensing Circuits for Resistive Memory," IEEE Electron Devices Society Boise Meeting, Boise, ID Oct. 25.

2001

2000

1999

1998

1997

1996

  • Bruce, J.D., Li H.W., Dallabetta, M.J., and Baker, R.J., "Analog layout using ALAS!" IEEE Journal of Solid State Circuits, Vol. 31, No. 2, pp. 271-274.

1995

1994

1993

1992

1991

1990

Additional Publications

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