Lab 8 : Generate a Test Chip Layout
EE 421L Digital IC Design
By: David Nakasone – Email: nakasd3@unlv.nevada.edu
Assigned: November 24, 2021
Due: December 1, 2021
Lab description >>>
This lab generates a test-chip layout for fabrication.
Several fundamental circuits are placed on this prototype chip.
In addition, the student places circuits of interest, pending availible space.
As the hardware is realized, the design process makes the student aware of additional considerations.
The group members of "Chip3_f21"
- David Nakasone { nakasd3 }
- Michael Parker { parkem3 }
- Matt
Testing a chip before fabrication is very important and can be very expensive if not correct.
When complete, this design can be sent to MOSIS for fabrication.
Each component must first be verified before it can be placed on the chip.
Next, the chip unit is tested to ensure proper operation.
There are two major tasks for this lab:
A) Complete and document “tutorial 6”
B) Establish a design process
C) Include the "31-stage ring oscillator with buffer driving a 20 pF off-chip load"
D) Include the "6u / 0.6u NAND gate"
E) Include the "6u / 0.6u NOR gate"
F) Include the "12u /6u inverter"
G) Include the "6u / 0.6u PMOS"
H) Include the "6u / 0.6u NMOS"
I) Include the "25k / 10k voltage divider"
J) boost switching power supply (SPS)
K) 3-bit full adder
L) final DRC -> LVS
M) pin assignments and data sheet
Part A : tutorial 6 >>>
Be familiar with the pin plan
[ 1 ] create a pad layout, verify with DRC
[ 2 ] copy a 12x12 array, after making a pin arry and deleting pad layer;
all the pins must be renamed
[ 3 ] ensure the pad frame is free from errors, there are now pins <1:40>
[ 4 ] make the schematic for the pad (just an input/output pin)
[ 5 ] make a symbol of the pad, from the schematic
[ 6 ] use an array to make a schematic of the pad frame symbol
[ 7 ] make a symbol of the pad frame schematic
[ 8 ] make a schematic of the chip
[ 9 ] place the components in a layout and verify with DRC, clean up layout for project
This is the basis for applying components to the actual chip.
Part B : design plan >>>
* each circuit requires its own power supply (pin), but ground is common to all on pin<20>
** connections have a minimum of 2 vias
*** DRC is completed after every connection is made on the chip
**** LVS is confirmed before adding another circuit to the chip
[ B1 ] pad frame
Using tutorial 6, the pad frame is in good working order.
Also, maintaining the 48 um standard cell height ensures accurate and efficient layout.
[ B2 ] layout cell
This cell is the basis for DRC and LVS of the entire chip.
Components are not allowed be placed on the chip until they are individually validated.
[ B2i ] the top-level schematic
[ B2ii ] adding new layouts to the chip
[ B3 ] test cell
This cell is a direct abstraction of the clean chip cell.
A seperate test bench was constructed to ensure that the manufacturer
receives the design exactly as specified.
On-chip testing can be
simulated here, as if the end user was operating the finished design.
[ B3i ] test cell schematic, components are placed exactly how layout was conducted:
[ B3ii ] test cell symbol
[ B3iii ] test cell application
Part C: ring oscillator >>>
[ C1 ] schematic, enable included to conserve power
[ C2 ] symbol (on-chip)
[ C3 ] testing (on-chip)
[ C4 ] DRC
[ C5 ] LVS
[ C6 ] placement
Part D: NAND gate >>>
[ D1 ] schematic
[ D2 ] symbol (on-chip)
[ D3 ] testing (on-chip)
[ D4 ] DRC
[ D5 ] LVS
[ D6 ] placement
Part E: NOR gate >>>
[ E1 ] schematic
[ E2 ] symbol (on-chip)
[ E3 ] testing (on-chip)
[ E4 ] DRC
[ E5 ] LVS
[ E6 ] placement
Part F: inverter >>>
[ F1 ] schematic
[ F2 ] symbol (on-chip)
[ F3 ] testing (on-chip)
[ F4 ] DRC
[ F5 ] LVS
[ F6 ] placement
Part G: PMOS >>>
[ G1 ] schematic
[ G2 ] symbol (on-chip)
[ G3 ] testing (on-chip)
[ G4 ] DRC
[ G5 ] LVS
[ G6 ] placement
Part H: NMOS >>>
[ H1 ] schematic
[ H2 ] symbol (on-chip)
[ H3 ] testing (on-chip)
[ H4 ] DRC
[ H5 ] LVS
[ H6 ] placement
Part I: voltage divider >>>
[ I1 ] schematic
[ I2 ] symbol (on-chip)
[ I3 ] testing (on-chip)
[ I4 ] DRC
[ I5 ] LVS
[ I6 ] placement
Part J: boost SPS >>>
[ J1 ] schematic
[ J2 ] symbol (on-chip)
[ J3 ] testing (on-chip)
[ J4 ] DRC
[ J5 ] LVS
[ J6i ] placement
[ J6ii ] placement, external
Part K: 3-bit full adder >>>
[ K1 ] schematic
[ K2 ] DRC
[ K3 ] LVS
[ K4 ] placement
Part L: final validation >>>
[L1 ] DRC of chip
[L2 ] LVS of chip
[L3 ] schematic
[L4 ] testing
Part M: data sheet >>>
Design files availible on request.