EE 421L – Digital IC Design Lab - Lab 8

Authored by Chris Barr, Darryl Derico, Shaquille Regis

Email: barrc1@unlv.nevada.edu, derico@unlv.nevad.edu, regis@unlv.nevada.edu

12/04/19

 

Zip File
lab8.zip

 

Lab Description:

This lab was a compilation of everything we learned over the semester. On the pad frame built from the beginning of the class, we instantiated multiple concepts we have covered in the lab, as well as multiple projects from both the lab and the lecture.

 

Prelab

Tutorial 6:

Created the pad using 120um x 120um sizing of the pad layer. Followed by a 75um x 75um metal3 layer and a 63um x 63um glass layer on top.

Tabulated Designs of the Pad:

Schematic

Symbol

Layout

 

 

 

 

 


 

 

 

 

 

 

 



With the acquired pad layout, the construction of the pad frame may begin. There will be 10 pads on each side.
The pad layer creates a 45um spacing in between each pad.

Tabulated Designs of the Pad frame:

Schematic

Symbol

Layout

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

The chip is ready to be constructed, given the pad frame is put together properly. A design can be placed onto the pad frame, as seen below.

Tabulated Designs of the Chip:

Schematic

Layout

 

 

 

 

 

 

 

This concludes Tutorial 6

 

 

Lab

Objective: Create a chip layout containing these components.

1.           PMOS

2.           NMOS

3.           Voltage Divider

4.           Ring Oscillator

5.           Inverter

6.           NAND Gate

7.           NOR Gate

8.           Boost SPS

9.           x4 Clock Multiplier

10.       Pad Frame

 

This is the main schematic for the chip. Every component listed above is on this figure.


Fig. 1 Chip Schematic

 


Fig. 2 Chip Schematic Pin Names in order

 

Pad Frame

The pad frame is the skeleton of the chip. It consists of 40 pads that can be used for multiple terminals. The pads are labeled 1 through 40 starting from the top pad on the right side of the chip, and increments clockwise ending with pad 40 on the rightmost pad at the top of the chip. Pads 30 through 40 are not connected to anything. All involved schematics have a common ground placed on pad 8. The connections were set in a way that would mostly separate the various terminals intended for an input voltage.

Reference Fig. 1 and Fig. 2 for the designated pin connections and descriptions.

 

PMOS

 

Schematic & Layout of the PMOS:

 


Fig. 3 PMOS Schematic

 


Fig. 4 PMOS Layout

 

 

Testing this device:
The relevant PMOS terminals are pads 1 through 4 and are referenced as PM<1:4> on the schematic. You would supply the g
ate voltage to pin 2, the drain voltage to pin 3, the source voltage to pin 1, and the body voltage to pin 4.

 

NMOS

 

Schematic & Layout of the NMOS:

 


Fig. 5 PMOS Schematic

 


Fig. 6 PMOS Layout

 

Testing the Device:

The relevant NMOS terminals are pads 5 through 7 and are referenced as NM<5:7> on the schematic. You would supply the gate voltage to pin 6, the drain voltage to pin 5, and the source voltage to pin 7.

 

Voltage Divider

 

Schematic & Layout of the Voltage Divider:

 


Fig. 7 Voltage Divider Schematic

 


Fig. 8 Voltage Divider Layout

 

Testing the Device:

The relevant Voltage Divider terminals are pads 9 through 10 and are referenced as VD<9:10> on the schematic. You would supply the input voltage through pin 10 and read the output from pin 9.

 

Ring Oscillator

 

Schematic & Layout of the Ring Oscillator:

 


Fig. 9 Ring Oscillator Schematic

 


Fig. 10 Ring Oscillator Layout

 

Testing the Device:

The relevant Ring Oscillator terminals are pads 11 through 12 and are referenced as RO<11:12> on the schematic. You would supply the input voltage to pin 11, and read the output signal resulting from the buffer from pin 12.

 

Inverter

 

Schematic & Layout of the Inverter:

 


Fig. 11 Inverter Schematic

 


Fig. 12 Inverter Layout

 

Testing the Device:

The relevant Inverter terminals are pads 13 through 15 and are referenced as INV<13:15> on the schematic. You would connect the source voltage or VDD to pin 15, the inverter input to pin 13, and read the output of the inverter from pin 14.

 

NAND Gate

 

Schematic & Layout of the NAND Gate:

 


Fig. 13 NAND Gate Schematic

 


Fig. 14 NAND Gate Layout

 

Testing the Device:

The relevant NAND Gate terminals are pads 16 through 19 and are referenced as NAND<16:19> on the schematic. You would connect the source voltage or VDD to pin 19, the inputs of the NAND gate to pin 16 and pin 17, and read the resulting signal from pin 18.

 

NOR Gate

 

Schematic & Layout of the NOR Gate:

 


Fig. 15 NOR Gate Schematic

 


Fig. 16 NOR Gate Layout

 

Testing the Device:

The relevant NOR Gate terminals are pads 20 through 23 and are referenced as NOR<20:23> on the schematic. You would connect the source voltage or VDD to pin 23, the inputs of the NOR gate to pin 20 and 21, and read the resulting signal from pin 22.

 

Boost SPS

 

Schematic & Layout of the Boost SPS:

 


Fig. 17 Boost SPS Schematic

 


Fig. 18 Boost SPS Layout

 

Testing the Device:

The relevant Boost SPS terminals are pads 24 through 26 and are referenced as SPS<24:26> on the schematic. You would connect the source voltage or VDD to pin 26, connect one end of the off-chip inductor and anode of the off-chip Schottky diode to pin 25, and connect the cathode of the off-chip Schottky diode, off-chip resistor, and off-chip capacitor to Vout.

 

x4 Clock Multiplier

 

Schematic & Layout of the x4 Clock Multiplier:

 


Fig. 19 x4 Clock Multiplier Schematic

 


Fig. 20 x4 Clock Multiplier Layout

 

Testing the Device:

The relevant x4 Clock Multiplier terminals are pads 27 through 29 and are referenced as CM<27:29> on the schematic. You would connect the source voltage or VDD to pin 29, and the clock to be multiplied to pin 27. The resulting multiplied clock can be read from pin 28.

 

Chip Verification

 


Fig. 21 Chip Layout

 


Fig. 22 Chip DRC Verification

 


Fig. 23 Chip LVS Verification

 

 

 

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Return to Shaquille Regis’ Labs