Lab 8 - ECE 421L 

Authored by, Vincent Ibanez, Gerald Lee, Chris Mikhael

Email: ibanez.troy.e@gmail.com, leeg28@unlv.nevada.edu, mikhaelc@unlv.nevada.edu

Today's date 11/30/2014

  



Main Lab:
  

The image seen at the below of the page shows how the chip's pads correspond to the pins of the 40 pin DIP package we will receive from MOSIS. 

1.png

Layout:




   





  
How to test the following structures:

    Note: Some of the Pins on the resistors are shared. When testing using the following test structures, ensure that you are testing one circuit at a time. Also, before testing any of the components, make sure that you connect ground to 0V.

   
   
     
   
   
   
   
     

 

We were able to LVS and DRC the design after removing the resistors that are causing the "shorting" issue on cadence.

      
 
Finally, we backed up our design lab8ilm.zip directory and other files for future study.



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